High temperature performance of dielectrically isolated LDMOSFET: Characterization, simulation and analysis

IEEE International Symposium on Power Semiconductor Devices & ICs

Volumn , Issue , 1994, Pages 359-364

  Sunkavalli, Ravishankar ^a   Jayant Baliga, B ^a   Huang, Y S ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC RESISTANCE; HIGH TEMPERATURE OPERATIONS; LEAKAGE CURRENTS; MATHEMATICAL MODELS; SUBSTRATES; TEMPERATURE MEASUREMENT;

DIELECTRIC ISOLATION; HIGH TEMPERATURE MEASUREMENTS; THRESHOLD VOLTAGE; TRANSCONDUCTANCE; TWO DIMENSIONAL;

MOSFET DEVICES;

EID: 0028695006     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (20)