Material electronic quality specification factors for polycrystalline silicon wafers

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn 2, Issue , 1994, Pages 1356-1359

  Bailey, Jeff ^a   Kalejs, J P ^a   Keaveny, C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; DIFFUSION; ELECTRONIC PROPERTIES; FIRING (OF MATERIALS); HYDROGEN; PASSIVATION; PHOTOCONDUCTIVITY; POLYCRYSTALLINE MATERIALS; QUALITY CONTROL; SILICON SOLAR CELLS; SURFACES;

DIFFUSION LENGTH; EDGE DEFINED FILM-FED GROWTH; INFRARED PHOTOCONDUCTIVE CURRENT METHOD; MATERIAL ELECTRONIC QUALITY SPECIFICATION FACTORS; SURFACE PHOTOVOLTAGE TECHNIQUE;

SILICON WAFERS;

EID: 0028692237     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)