Novel 3 volts-only, small sector erase, high density flash E2PROM

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 1994, Pages 71-72

  Kianian, Sohrab ^a   Levi, Amitay ^a   Lee, Dana ^a   Hu, Yaw Wen ^a  

^a SILICON STORAGE TECHNOLOGY INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CELLULAR ARRAYS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELDS; ELECTRON TUNNELING; GATES (TRANSISTOR); RELIABILITY;

CHARGE TRAPPING; FLOTOX TECHNOLOGY; PUNCH THROUGH; TUNNEL DISTURB;

PROM;

EID: 0028607820     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)