Electrical failure analysis in high density DRAMs

Volumn , Issue , 1994, Pages 26-31

  Chan, Adrian ^a   Lam, David ^a   Tan, Wilson ^a   Swee, Yong Khim ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER TESTING; ELECTRIC FAULT LOCATION; FAILURE ANALYSIS; REDUNDANCY;

DESIGN FOR TESTABILITY; ELECTRICAL FAILURE ANALYSIS;

RANDOM ACCESS STORAGE;

EID: 0028599739     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)