Structural study of hydrogen induced platelet in Si and Ge by transmission electron microscopy

Materials Science Forum

Volumn 143-4, Issue pt 2, 1994, Pages 897-902

  Muto, S ^a   Takeda, S ^a   Hirata, M ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL IMPURITIES; CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; GASES; HYDROGEN; IMAGE ANALYSIS; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; STRAIN; TRANSMISSION ELECTRON MICROSCOPY; VAPOR PRESSURE;

DIFFRACTION CONTRAST IMAGES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; HYDROGEN INDUCED PLATELET;

CRYSTAL DEFECTS;

EID: 0028598985     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (16)