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Volumn , Issue , 1994, Pages 89-94

Measurement & location of dielectric anomalies in field aged XLPE cables

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; CAPACITANCE; DEFECTS; DIELECTRIC DEVICES; ELECTRIC IMPEDANCE; FAILURE (MECHANICAL); POLYETHYLENES; REFLECTOMETERS; SERVICE LIFE; VOLTAGE MEASUREMENT;

EID: 0028584980     PISSN: 01642006     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (5)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.