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Volumn 102, Issue 6, 1994, Pages 1200-1227
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Learning-by-doing spillovers in the semiconductor industry
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
DYNAMIC RANDOM ACCESS MEMORY;
LEARNING-BY-DOING;
SEMI-CONDUCTOR INDUSTRY;
SPILLOVER;
USA;
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EID: 0028584051
PISSN: 00223808
EISSN: None
Source Type: Journal
DOI: 10.1086/261968 Document Type: Article |
Times cited : (363)
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References (0)
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