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Volumn , Issue , 1994, Pages 220-227
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IVIS: an integrated volumetric inspection system
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTATIONAL COMPLEXITY;
COMPUTER AIDED DESIGN;
COMPUTER SIMULATION;
FITS AND TOLERANCES;
GEOMETRY;
IMAGE ANALYSIS;
IMAGE CODING;
IMAGE SENSORS;
ITERATIVE METHODS;
PRODUCTION;
SENSOR DATA FUSION;
THREE DIMENSIONAL;
ACTUAL OBJECT;
INTEGRATED VOLUMETRIC INSPECTION SYSTEM;
LEAST MATERIAL CONDITION;
MOST MATERIAL CONDITION;
OCTREE ENCODING;
REFERENCE OBJECT;
VOLUMETRIC MODELS;
INSPECTION;
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EID: 0028583712
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (7)
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References (8)
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