Why cellular automata are better than LFSRs as built-in self-test generators for sequential-type faults

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 1, Issue , 1994, Pages 69-72

  Zhang, S ^a   Byrne, R ^a   Muzio, J C ^a   Miller, D M ^a  

^a UNIVERSITY OF VICTORIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; COMPUTER HARDWARE; COMPUTER SIMULATION; NUMERICAL ANALYSIS; SEQUENTIAL CIRCUITS; SHIFT REGISTERS; STANDARDS; VECTORS;

BUILT IN SELF TEST; DATA COMPACTOR; LINEAR FEEDBACK SHIFT REGISTERS; LINEAR HYBRID CELLULAR AUTOMATA;

FINITE AUTOMATA;

EID: 0028581588     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)