Random generation of test instances for logic optimizers

Proceedings - Design Automation Conference

Volumn , Issue , 1994, Pages 430-434

  Iwama, Kazuo ^a   Hino, Kensuke ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADDERS; ALGORITHMS; BOOLEAN FUNCTIONS; EQUIVALENT CIRCUITS; GRAPH THEORY; LOGIC CIRCUITS; MATHEMATICAL TRANSFORMATIONS; OPTIMIZATION; PERFORMANCE; POLYNOMIALS; RANDOM NUMBER GENERATION; RANDOM PROCESSES;

LOGIC OPTIMIZERS; RANDOM TEST CIRCUITS;

LOGIC DESIGN;

EID: 0028573039     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/196244.196452     Document Type: Conference Paper

References (8)