Optimization of Thin-Film Tips for Magnetic Force Microscopy

IEEE Transactions on Magnetics

Volumn 30, Issue 6, 1994, Pages 4503-4505

  Loper, Steve ^b   Elings, Virgil ^a   Dugas, Matthew ^a  

^a Digital Instruments   (United States)

^b Advanced Research Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COATED MATERIALS; COERCIVE FORCE; FABRICATION; HARD DISK STORAGE; LITHOGRAPHY; MAGNETIC PROPERTIES; MECHANICAL PROPERTIES; MICROSCOPIC EXAMINATION; OPTIMIZATION; SENSITIVITY ANALYSIS; SPUTTER DEPOSITION; SUBSTRATES;

CANTILEVER RESONANT FREQUENCY; DISK STRAY FIELDS; MAGNETIC FORCE MICROSCOPY; RELATIVE SENSITIVITY; TIP COATINGS;

MAGNETIC THIN FILMS;

EID: 0028550649     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.334130     Document Type: Article

References (4)

1. P. Grütter, H.J. Mamin, and D. Rugar, “Magnetic Force Microscopy,” in Scanning Probe Microscopy II, New York: Springer-Verlag, 1991; P. Grütter, “An Introduction to Magnetic Force Microscopy”, MSA Bulletin, vol.24, pp. 416–425 1994.
2. P. Grütter, D. Rugar, H.J. Mamin, and G. Castillo, “Batch Fabricated Sensors For Magnetic Force Microscopy,” J. Appl. Phys., vol. 57, pp. 1820–1822 October 1990.
3. D. Rugar, H.J. Mamin, P. Guenther, S.E. Lambert, J.E. Stern, I. McFadyen, and T. Yogi, “Magnetic Force Microscopy: General Principles and Application to Longitudinal Recording Media,”.J. Appl. Phys., vol. 68, pp. 1169–1183 August 1990.
4. R. Proksch, “Magnetic Force Microscopy,” Ph.D. Thesis, University of Minnesota Dept, of Physics, 1993.