Magnetic Force Microscopy Study of Edge Overwrite Characteristics in Thin Film Media

IEEE Transactions on Magnetics

Volumn 30, Issue 6, 1994, Pages 4242-4244

  Zhu, Jian Gang ^a   Luo, Yansheng ^a   Ding, Juren ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA RECORDING; DESIGN; ERRORS; IMAGING TECHNIQUES; MAGNETIC HEADS; MAGNETIC PROPERTIES; MAGNETIZATION; MICROSCOPIC EXAMINATION; PERFORMANCE; REMANENCE;

EDGE OVERWRITE CHARACTERISTICS; MAGNETIC FORCE MICROSCOPY; OFF TRACK PERFORMANCE; THIN FILM MEDIA;

MAGNETIC DISK STORAGE;

EID: 0028549844     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.334048     Document Type: Article

References (4)

1. T. Lin, J.A. Christner, T.B. Mitchell, J.S. Gau, and P.K. George, “Effects of Current and Frequency on Write, Read, and Erase Widths for Thin-Film Inductive and Magnetoresistive Heads,” IEEE Trans. Magn. MAG-25, 710 (1989)
2. T.C. Amoldussen and L.L. Nunnelley, F.J. Martin and R.P. Ferrier, “Side writing/reading in magnetic recording,” J. Appl. Phys., 69,4718,(1991).
3. John Coker, Private communication.
4. X.G. Ye, J.-G. Zhu, and T.C. Amoldussen, “Track edge overwrite and easy axis orientation in narrow track recording,” IEEE Trans. Magn., vol.29, 3978 (1993).