Low-Frequency Noise in Modern Bipolar Transistors: Impact of Intrinsic Transistor and Parasitic Series Resistances

IEEE Transactions on Electron Devices

Volumn 41, Issue 11, 1994, Pages 1981-1991

  Kleinpenning, Theo G M ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC RESISTANCE; HETEROJUNCTIONS; MATHEMATICAL MODELS; RESISTORS; SIGNAL NOISE MEASUREMENT; SIGNAL TO NOISE RATIO; SPURIOUS SIGNAL NOISE;

CURRENT FLUCTUATION; HETEROJUNCTION BIPOLAR TRANSISTORS; HIGHER BIAS CURRENTS; LOW FREQUENCY NOISE; PARASITIC SERIES RESISTANCE;

BIPOLAR TRANSISTORS;

EID: 0028549703     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.333815     Document Type: Article

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