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Volumn 30, Issue 6, 1994, Pages 4878-4880
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Correlation Between Magnetic and Structural Properties of Ni80Fe20Sputtered Thin Films Deposited on Cr and Ta Buffer Layers
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Author keywords
[No Author keywords available]
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Indexed keywords
ANISOTROPY;
CHROMIUM;
COERCIVE FORCE;
CRYSTAL STRUCTURE;
GRAIN SIZE AND SHAPE;
MAGNETIC PROPERTIES;
MAGNETIZATION;
NICKEL ALLOYS;
SPUTTER DEPOSITION;
TANTALUM;
TEXTURES;
TRANSMISSION ELECTRON MICROSCOPY;
BUFFER LAYERS;
DIFFRACTION PATTERNS;
PERMALLOYS;
THIN FILMS;
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EID: 0028548924
PISSN: 00189464
EISSN: 19410069
Source Type: Journal
DOI: 10.1109/20.334252 Document Type: Article |
Times cited : (29)
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References (7)
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