Fluctuations and Noise of Hot Carriers in Semiconductor Materials and Devices

IEEE Transactions on Electron Devices

Volumn 41, Issue 11, 1994, Pages 2034-2049

  Nougier, Jean Pierre ^a  

^a UNIVERSITÉ MONTPELLIER II   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; MATHEMATICAL MODELS; NUMERICAL METHODS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; SIGNAL NOISE MEASUREMENT; SPURIOUS SIGNAL NOISE; TRANSPORT PROPERTIES;

BOLTZMANN EQUATION; IMPEDANCE FIELD METHODS; NOISE SOURCES; NOISE TEMPERATURE;

HOT CARRIERS;

EID: 0028548617     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.333821     Document Type: Article

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