Polarization-dependent EXAFS Studies of Chemical and Structural Anisotropy in Sputter-deposited Co78Cr22 Films

IEEE Transactions on Magnetics

Volumn 30, Issue 6, 1994, Pages 4017-4019

  Lodder, C J ^b   Harris, V G ^a   Elam, W T ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ATOMS; CHROMIUM; COBALT; COBALT ALLOYS; FILM GROWTH; MAGNETIC DISK STORAGE; POLARIZATION; SPUTTER DEPOSITION; STRUCTURE (COMPOSITION); X RAY ANALYSIS;

COMPOSITIONAL INHOMOGENEITIES; POLARIZATION DEPENDENT EXTENDED X RAY ABSORPTION FINE STRUCTURE; STACKING FAULTS;

MAGNETIC FILMS;

EID: 0028547750     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.333975     Document Type: Article

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