Stability and biasing characteristics of a permanent magnet biased sal/mr device

IEEE Transactions on Magnetics

Volumn 30, Issue 6, 1994, Pages 3855-3857

  Kobayashi, Toshio ^b   Torng, Terry ^a  

^a Applied Magnetics Corporation   (United States)

^b Magnetic & Electronic Materials Research Laboratory Hitachi Metals Ltd ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COBALT ALLOYS; COERCIVE FORCE; DEPOSITION; FABRICATION; FERROMAGNETIC MATERIALS; MAGNETIC DOMAINS; MAGNETIC PROPERTIES; PERMANENT MAGNETS; SENSORS; STABILITY; THERMAL EFFECTS;

BARKHAUSEN NOISE; EXCHANGE COUPLING EFFECT; FERROMAGNETIC MAGNETORESISTIVE LAYER; PERMANENT LAYER THIN FILM;

MAGNETIC THIN FILMS;

EID: 0028547656     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.333923     Document Type: Article

References (6)

1. A. Yelon, “Physics of Thin Films, ed. by M. Francombe and R. Hoffman, Academic Press, New York, Vol. 6, 205 (1971)
2. K. Ounadjela, G. Suran, “ Exchange coupling between a soft and a hard ferromagnetic thin film,” J. Appl. Phys., Vol. 63, No. 8, p.3245,1988.
3. C. Tsang, “Unshielded MR elements with patterned exchange-biasing,” IEEE, Trans. Mag., MAG-25, p. 3692, 1989.
4. T. Torng, S. Liao, T. Kobayashi, to be published.
5. R. D. Hempstead, S. Krongelb, D. A. Thompson, “Unidirectional anisotropy in nickel-iron films by exchange coupling with antiferromagnetic films,” IEEE. Trans. on Mag. Vol. 14, pp. 521, 1978.
6. S. H. Liao, S. W. Yuan, N. H. Bertram, “Biasing characteristics of unshielded, boundary exchange-coupled SAL/MR sensors,” IEEE. Trans. on Mag., vol. 29, No. 6, p.3873, 1993.