Analytical and Experimental Studies of Thermal Noise in MOSFET’s

IEEE Transactions on Electron Devices

Volumn 41, Issue 11, 1994, Pages 2069-2075

  Tedja, Suharli ^a   der Spiegel, Jan Van ^a   Williams, Hugh H ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CHARGE CARRIERS; CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; MATHEMATICAL MODELS; SIGNAL NOISE MEASUREMENT; THERMAL NOISE; THERMODYNAMIC STABILITY; TRANSISTORS; TRANSPORT PROPERTIES;

BODY EFFECT; CHANNEL THERMAL NOISE; CMOS PROCESS; INVERSION REGION; ONE DIMENSIONAL CHARGE SHEET MODEL;

MOSFET DEVICES;

EID: 0028547602     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.333824     Document Type: Article

References (18)

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