Microscopic Simulation of Electronic Noise in Semiconductor Materials and Devices

IEEE Transactions on Electron Devices

Volumn 41, Issue 11, 1994, Pages 1916-1925

  Gonzalez, Tomas ^d   Pardo, Daniel ^d  

^a UNIV MONTPELLIER   (France)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^c UNIVERSITY OF STUTTGART   (Germany)

^d UNIVERSITY OF SALAMANCA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; ELECTRIC CURRENTS; ELECTRIC DISTORTION; ELECTRIC FIELD EFFECTS; HOT CARRIERS; MATHEMATICAL MODELS; MONTE CARLO METHODS; RESISTORS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; SPECTRUM ANALYSIS;

CARRIER VELOCITY; CURRENT FLUCTUATION; ELECTRONIC NOISE; HOT CARRIER EFFECTS; MICROSCOPIC SIMULATION; NOISE SPECTROSCOPY; POISSON SOLVER; VOLTAGE NOISE;

SPURIOUS SIGNAL NOISE;

EID: 0028547277     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.333807     Document Type: Article

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