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Volumn 9, Issue 11, 1994, Pages 2907-2913

Origins of microplasticity in low-load scratching of silicon

Author keywords

[No Author keywords available]

Indexed keywords

CRACK PROPAGATION; CRYSTAL MICROSTRUCTURE; DAMPING; DISLOCATIONS (CRYSTALS); DUCTILITY; LOADS (FORCES); MECHANICAL TESTING; PHASE TRANSITIONS; PLASTIC DEFORMATION; PLASTICITY; PRESSURE EFFECTS;

EID: 0028542759     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/JMR.1994.2907     Document Type: Article
Times cited : (54)

References (26)
  • 24
    • 0001818087 scopus 로고
    • edited by W. D. Nix, J. C. Bravman, E. Arzt, and L. B. Freund (Mater. Res. Soc. Symp. Proc. 239, Pittsburgh, PA
    • G. M. Pharr, in Thin Films: Stresses and Mechanical Properties III, edited by W. D. Nix, J. C. Bravman, E. Arzt, and L. B. Freund (Mater. Res. Soc. Symp. Proc. 239, Pittsburgh, PA, 1992), p. 301.
    • (1992) Thin Films: Stresses and Mechanical Properties III , pp. 301
    • Pharr, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.