Characterization of transparent conducting CdO films deposited by spray pyrolysis

Semiconductor Science and Technology

Volumn 9, Issue 10, 1994, Pages 1827-1832

  Gurumurugan, K ^a   Mangalaraj, D ^a   Narayandass, S K ^a   Sekar, K ^b   Girija Vallabhan, C P ^b  

^a BHARATHIAR UNIVERSITY   (India)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

BANDGAPS; CONDUCTING CADMIUM OXIDE FILM; RUTHERFORD BACKSCATTERING SPECTROMETRY; SPRAY PYROLYSIS; THERMOELECTRIC POWER MEASUREMENT; X RAY DIFFRACTION;

CADMIUM COMPOUNDS; CONDUCTIVE FILMS; DEPOSITION; ENERGY GAP; PYROLYSIS; REFRACTIVE INDEX; SPECTROMETRY; X RAY ANALYSIS;

THIN FILMS;

EID: 0028526044     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/9/10/013     Document Type: Article

References (23)

1. Quantum efficiency and optical transitions of CdO photoanodes
2. Structural, optical, and electrical properties of cadmium oxide films deposited by spray pyrolysis
3. Optical and Electrical Properties of Semiconducting Cadmium Oxide Films
4. Constitution and Mechanism of the Selenium Rectifier Photocell
5. Electrical and Optical Properties of Sputtered CdO Films
6. III. Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray debye-scherrer spectrum