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Volumn 13, Issue 3-4, 1994, Pages 105-192

Nonequilibrium point defects and diffusion in silicon

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DIFFUSION IN SOLIDS; DISLOCATIONS (CRYSTALS); ION IMPLANTATION; PRECIPITATION (CHEMICAL); PROCESS CONTROL; THERMOOXIDATION;

EID: 0028523288     PISSN: 0927796X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0927-796X(94)90009-4     Document Type: Article
Times cited : (86)

References (369)
  • 267
    • 84911324282 scopus 로고    scopus 로고
    • S.M. Hu. U.S. Patent 4,053,335, October 11 1977.
  • 339
    • 84911346061 scopus 로고    scopus 로고
    • H. Shibayama, H. Masaki and H. Hashimoto, Appl. Phys. Lett., 27 (230).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.