A Simple Approach to Modeling CrossTalk in Integrated Circuits

IEEE Journal of Solid-State Circuits

Volumn 29, Issue 10, 1994, Pages 1212-1219

  Joardar, Kuntal ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CROSSTALK; EQUIVALENT CIRCUITS; LUMPED PARAMETER NETWORKS; MOS DEVICES; MOSFET DEVICES; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SPURIOUS SIGNAL NOISE; SUBSTRATES;

GUARD RING SUBSTRATE; LUMPED PARAMETER EQUIVALENT CIRCUITS; MICROSCOPIC PERSPECTIVE; TWO DIMENSIONAL DEVICE SIMULATION;

VLSI CIRCUITS;

EID: 0028517306     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.315205     Document Type: Article

References (6)

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6. L. Deferm, C. Claeys, and G. J. Declerk, “Two and three-dimensional calculation of substrate resistance,” IEEE Trans. Electron Devices, vol. 35, pp. 339–351, March 1988.