Apertureless near-field optical microscope

Applied Physics Letters

Volumn 65, Issue 13, 1994, Pages 1623-1625

  Zenhausern, F ^a   O'Boyle, M P ^a   Wickramasinghe, H K ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; LIGHT SCATTERING; MICROSCOPIC EXAMINATION; MODULATION; OPTICAL RESOLVING POWER; REFRACTIVE INDEX; SILICON; SURFACES;

NEAR FIELD SCANNING MICROSCOPY; OPTICAL MICROSCOPE;

MICROSCOPES;

EID: 0028515488     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.112931     Document Type: Article

References (0)