The Effects of Impact Ionization on the Operation of Neighboring Devices and Circuits

IEEE Transactions on Electron Devices

Volumn 41, Issue 9, 1994, Pages 1603-1607

  Sakui, Koji ^a   Wong, S Simon ^a   Wooley, Bruce A ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; HOT CARRIERS; MOSFET DEVICES; NETWORKS (CIRCUITS); OSCILLATORS (ELECTRONIC); PHOTONS; RELIABILITY; SEMICONDUCTOR JUNCTIONS;

ELECTRON HOLE PAIRS; EXCESS MAJORITY CARRIERS; IMPACT IONIZATION; NMOS RING OSCILLATOR; NMOS TRANSISTOR;

IONIZATION;

EID: 0028514382     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.310112     Document Type: Article

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