Threshold voltage mismatch in short-channel MOS transistors

Electronics Letters

Volumn 30, Issue 18, 1994, Pages 1546-1548

  Steyaert, M ^a   Bastos, J ^a   Roovers, R ^a   Kinget, P ^a   Sansen, W ^a   Graindourze, B ^b   Pergoot, A ^b   Janssens, Er ^b  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

CMOS integrated circuits; Transistors

Indexed keywords

CHARGE CARRIERS; CMOS INTEGRATED CIRCUITS; GATES (TRANSISTOR); SEMICONDUCTOR DEVICE MODELS;

SHORT CHANNEL MOS TRANSISTORS; THRESHOLD VOLTAGE MISMATCH;

MOS DEVICES;

EID: 0028513902     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19940999     Document Type: Article

References (6)

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3. Pelgrom, M. J. M., Duinmaijer, A. C. J., and Welbers, A. P. G.: ‘Matching properties of MOS transistors’, IEEE J. Solid State Circuits, 1989, SC-24. pp. 1433-1439
4. Abel, C. J., Michael, C., Ismail, M., Teno, C., and Lahri, R.: ‘Characterization of transistor mismatch for statistical CAD of submicron CMOS analog circuits’. Proc. ISCAS-93, 1993, pp. 1401-1404
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6. Rey, W. J. J.: ‘Introduction to robust and quasi-robust statistical methods’ (Berlin: Springer-Verlag, 1983)