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Volumn 13, Issue 9, 1994, Pages 1166-1170

BSIM_plus: An Advanced SPICE Model for Submicron MOS VLSI Circuits

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; ELECTRIC CURRENTS; LINEAR INTEGRATED CIRCUITS; LOGIC DESIGN; MATHEMATICAL MODELS; MOS DEVICES; TRANSISTORS; VLSI CIRCUITS;

EID: 0028501283     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.310905     Document Type: Article
Times cited : (6)

References (12)
  • 5
    • 0023401686 scopus 로고
    • BSIM: Berkeley short-channel IGFET model for MOS transistors
    • Aug.
    • B. J. Sheu, D. L. Scharfetter, P. K. Ko, and M.C. Jeng, “BSIM: Berkeley short-channel IGFET model for MOS transistors,” IEEE J. Solid-State Circuits, vol. 22, no. 4, pp. 558–566, Aug. 1987.
    • (1987) IEEE J. Solid-State Circuits , vol.22 , Issue.4 , pp. 558-566
    • Sheu, B.J.1    Scharfetter, D.L.2    Ko, P.K.3    Jeng, M.C.4
  • 6
    • 0026841727 scopus 로고
    • Explicit geometry dependence of MOS transistor parameters by the pseudo-boundary method
    • Apr.
    • S. M. Gowda and B. J. Sheu, “Explicit geometry dependence of MOS transistor parameters by the pseudo-boundary method,” Analog Integrated Circuits and Signal Processing, vol. 2, no. 2, pp. 105–115. Apr. 1992.
    • (1992) Analog Integrated Circuits and Signal Processing , vol.2 , Issue.2 , pp. 105-115
    • Gowda, S.M.1    Sheu, B.J.2
  • 9
    • 0023998115 scopus 로고
    • An MOS transistor charge model for VLSI design
    • Apr.
    • B. J. Sheu, W.J. Hsu, and P.K. Ko, “An MOS transistor charge model for VLSI design,” IEEE Trans. Computer-Aided Design, vol. 7, no. 4, pp. 520–527, Apr. 1988.
    • (1988) IEEE Trans. Computer-Aided Design , vol.7 , Issue.4 , pp. 520-527
    • Sheu, B.J.1    Hsu, W.J.2    Ko, P.K.3
  • 10
    • 0026119875 scopus 로고
    • Design of reliable VLSI circuits using simulation techniques
    • Mar.
    • W.J. Hsu, B.J. Sheu, and S. M. Gowda, “Design of reliable VLSI circuits using simulation techniques,” IEEE J. Solid-State Circuits, vol. 26, no. 3, pp. 452–457, Mar. 1991.
    • (1991) IEEE J. Solid-State Circuits , vol.26 , Issue.3 , pp. 452-457
    • Hsu, W.J.1    Sheu, B.J.2    Gowda, S.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.