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Volumn 15, Issue 9, 1994, Pages 324-326

2.9 V Operation GaAs Power MESFET with 31.5-dBm Output Power and 64% Power-Added Efficiency

Author keywords

[No Author keywords available]

Indexed keywords

EFFICIENCY; GATES (TRANSISTOR); MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH;

EID: 0028499868     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/55.311122     Document Type: Article
Times cited : (28)

References (9)
  • 1
    • 0027277651 scopus 로고
    • Low voltage GaAs power amplifiers for personal communications at 1.9 GHz
    • D. Ngo, B. Beckwith, P. O’Neil, and N. Camilleri, “Low voltage GaAs power amplifiers for personal communications at 1.9 GHz,” in IEEE MIT·S Digest, 1993, pp. 1461–1464.
    • (1993) IEEE MIT·S Digest , pp. 1461
    • Ngo, D.1    Beckwith, B.2    O’Neil, P.3    Camilleri, N.4
  • 2
    • 0027307622 scopus 로고
    • 3 V operation L-band power double-doped heterojunction FET's
    • N. Iwata, K. Inosako, and M. Kuzuhara, “3 V operation L-band power double-doped heterojunction FET's,” in IEEE MTT-S Digest, 1993. pp. 1465–1468.
    • (1993) IEEE MTT-S Digest , pp. 1465
    • Iwata, N.1    Inosako, K.2    Kuzuhara, M.3
  • 3
    • 0027617624 scopus 로고
    • A high power-added efficiency GaAs power MESFET and MMIC operating at a very low drain bias for use in personal handy phones
    • S. Murai, T. Sawai, T. Yamaguchi, and Y. Harada, “A high power-added efficiency GaAs power MESFET and MMIC operating at a very low drain bias for use in personal handy phones,” IEICE Trans. Electron., vol. E76-C, pp. 901–907, 1993.
    • (1993) IEICE Trans. Electron. , vol.E76-C , pp. 901-907
    • Murai, S.1    Sawai, T.2    Yamaguchi, T.3    Harada, Y.4
  • 5
    • 36449008809 scopus 로고
    • Improvement of breakdown characteristics of GaAs power FET using (NH4)2Sx treatment
    • J.-L. Lee, D. Kim, S. J. Maeng, H. H. Park, J. Y. Kang, and Y. T. Lee, “Improvement of breakdown characteristics of GaAs power FET using (NH4) 2 S x treatment,” J. of Appl. Phys., vol. 73, pp. 3539–3524, 1993.
    • (1993) J. of Appl. Phys. , vol.73 , pp. 3524-3539
    • Lee, J.-L.1    Kim, D.2    Maeng, S.J.3    Park, H.H.4    Kang, J.Y.5    Lee, Y.T.6
  • 6
    • 0022024901 scopus 로고
    • Optical single layer lift-off process
    • H. Moritz, “Optical single layer lift-off process,” IEEE Electron Devices, vol. 32, pp. 672–676, 1985
    • (1985) IEEE Electron Devices , vol.32 , pp. 672-676
    • Moritz, H.1
  • 7
    • 0019613395 scopus 로고
    • Alloyed ohmic contacts to GaAs
    • N. Bra s lau, “Alloyed ohmic contacts to GaAs,” J. Vac. Sci. Technol., vol. 19, pp. 803–807, 1981.
    • (1981) J. Vac. Sci. Technol
    • Braslau, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.