On the High Electric Field Mobility Behavior in Si MOSFET's from Room to Liquid Helium Temperature

physica status solidi (a)

Volumn 145, Issue 1, 1994, Pages 217-221

  Rais, K ^a   Balestra, F ^a   Ghibaudo, G ^a  

^a ENSERG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRIC FIELDS; ELECTRON TRANSPORT PROPERTIES; SEMICONDUCTING SILICON; THERMAL EFFECTS;

DRAIN CURRENT; LIQUID HELIUM TEMPERATURE; TRANSCONDUCTANCE;

MOSFET DEVICES;

EID: 0028495320     PISSN: 00318965     EISSN: 1521396X     Source Type: Journal    
DOI: 10.1002/pssa.2211450120     Document Type: Article

References (9)