Reflection-scanning near-field optical microscopy and spectroscopy of opaque samples

Applied Physics A Solids and Surfaces

Volumn 59, Issue 2, 1994, Pages 103-108

  Bielefeldt, H ^a   Horsch I ^b   Krausch, G ^a   Lux Steiner, M ^a   Mlynek, J ^a   Marti, O ^b  

^a UNIVERSITY OF KONSTANZ   (Germany)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

07.60.Pb; 07.65.Eh; 78.65 s

Indexed keywords

LIGHT EMISSION; LIGHT REFLECTION; OPACITY; PHOTOLUMINESCENCE; SEMICONDUCTOR LASERS; SPATIAL VARIABLES CONTROL; SPECTROMETERS; SPECTROSCOPIC ANALYSIS;

OPTICAL SIGNALS; SCANNING NEARFIELD MICROSCOPY; SHEARFORCE FEEDBACK SYSTEM; TOPOGRAPHY;

MICROSCOPES;

EID: 0028493230     PISSN: 07217250     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/BF00332201     Document Type: Article

References (13)