Secondary ion mass spectrometry applied to the study of ion-exchanged glass waveguides with a few modes

International Journal of Optoelectronics

Volumn 9, Issue 4, 1994, Pages 359-363

  Gonella, F ^a   Caccavale, F ^a   Quaranta, A ^a  

^a UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; DIFFUSION IN SOLIDS; INTEGRAL EQUATIONS; INTERPOLATION; ION EXCHANGE; MASS SPECTROMETRY; OPTICAL GLASS; POLYNOMIALS; POTASSIUM; REFRACTIVE INDEX; SILVER; STRESS ANALYSIS;

ION EXCHANGED GLASS SYSTEMS; SECONDARY ION MASS SPECTROMETRY;

OPTICAL WAVEGUIDES;

EID: 0028479178     PISSN: 09525432     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)