On the use of the modulated reflectance microscopy in the study of laser diode facets: detection of surface defects

Journal De Physique. IV : JP

Volumn 4, Issue 7, 1994, Pages

  Mansanares, A M ^a   Roger, J P ^a   Fournier, D ^a   Boccara, A C ^a  

^a INSTITUT LANGEVIN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRIC VARIABLES MEASUREMENT; HETEROJUNCTIONS; MAPS; MICROSCOPIC EXAMINATION;

BIASED DEVICES; MODULATED REFLECTANCE MODE; NONBIASED DEVICES;

SEMICONDUCTOR LASERS;

EID: 0028478540     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1994750     Document Type: Article

References (8)