A low-pressure, micro-strip gas chamber operated with secondary-electron emission

Nuclear Inst. and Methods in Physics Research, A

Volumn 346, Issue 1-2, 1994, Pages 102-106

  Anderson, D F ^a   Kwan, S ^a   Salomon, M ^b  

^a FERMI NATIONAL ACCELERATOR LABORATORY   (United States)

^b TRIUMF   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CESIUM COMPOUNDS; COLLIDING BEAM ACCELERATORS; ELECTRIC DISCHARGES; ELECTRON EMISSION; IODINE COMPOUNDS; IONIZATION OF SOLIDS; MICROSTRIP DEVICES; SURFACES;

CESIUM IODINE COMPOUNDS; DISCHARGE SENSITIVITY; FAST SIGNALS; GAIN RESOLUTIONS; MICROSTRIP GAS CHAMBERS; PRIMARY IONIZATION SOURCES; SECONDARY ELECTRON EMISSION; TIMING RESOLUTIONS;

IONIZATION CHAMBERS;

EID: 0028464730     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(94)90692-0     Document Type: Article

References (13)

1. Minimum Ionizing Particle Detection by Secondary Electron Emission
2. presented at the 3rd London Conf. on Position-Sensitive Detectors London
3. WIS-93/63/July-PH
4. Spark Gaps and Secondary Emission Counters for Time of Flight Measurement