Reducing Local Oscillator Phase Noise Limitations on the Frequency Stability of Passive Frequency Standards: Tests of a New Concept

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 41, Issue 4, 1994, Pages 518-521

  Szekely, Csaba ^a   Walls, Fred L ^a   Lowe, John P ^a   Drollinger, R E ^a   Novick, A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER COMMUNICATION; FREQUENCY MODULATION; FREQUENCY STABILITY; MEASUREMENTS; NOTCH FILTERS; OSCILLATORS (ELECTRONIC); PERFORMANCE; Q FACTOR MEASUREMENT; RESONANCE; RESONATORS; SECOND HARMONIC GENERATION; SPURIOUS SIGNAL NOISE;

ATOMIC RESONANCE; CARRIER FREQUENCY; FRACTIONAL FREQUENCY STABILITY; LOCAL OSCILLATOR PHASE NOISE; PASSIVE FREQUENCY STANDARDS; SINEWAVE MODULATION;

FREQUENCY STANDARDS;

EID: 0028463634     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/58.294113     Document Type: Article

References (13)

1. G. Kramer, “Noise in passive frequency standards,” CPEM 1974 Dig., IEEE Conf. Pub. No. 113, IEEE Cat. No. CH0770-817.
2. F. L. Walls and S. R. Stein, “Servo technique in oscillators and measurement systems,” NBS Tech. Note 692, U.S. Govt. Printing Office, Wash. DC, SD Cat. No. C1346:692, 1976.
3. L. S. Cutler, private communication, Sept. 1988, Hewlett Packard, P.O. Box 10350, Palo Alto, CA 94303–0867.
4. C. Audoin, V. Chandelier, and N. Dimarcq, “A limit to the frequency stability of passive frequency standards,” IEEE Trans. Instrum. Meas., vol. 40. pp. 121–125, 1991.
5. R. Barillet, V. Giordano, J. Viennet, and C. Audo in, “Microwave interrogation frequency noise and clock frequency stability: Experimental results,” Proc. 6th EFTF, 1992.
6. J. C. Camparo and R. P. Frueholz, “Fundamental stability limits for the diode-laser-pumped rubidium atomic frequency standard,” J. Appl. Phys., vol. 59, pp. 3313–3317, 1986.
7. J. P. Lowe, F. L. Walls, and R. E. Drollinger, “Ultra-high stability synthesizer for diode laser pumped rubidium,” Proc. IEEE Freq. Cont. Symp., 1992.
8. S. R. Stein and J. P. Tumeaure, “The development of the superconducting cavity stabilized oscillator,” Proc. 27th Annu. Freq. Contr. Symp., 1973, p. 414.
9. G. J. Dick and J. Saunders, “Measurement and analysis of a microwave oscillator stabilized by a sapphire dielectric ring resonator for ultra low noise,” IEEE Trans. Ultrason. Ferroelec. Freq. Contr., vol. 37, pp. 339–346, Sept. 1990.
10. A. G. Mann, A. N. Luiten, D. G. Blair, and M. J. Buckingham, “Ultra-stable cryogenic sapphire dielectric microwave resonators,” Proc. IEEE 46th Annual Freq. Contr. Symp., 1992, pp. 167–171.
11. B. Smythe, Piezo Technology Inc., P.O. Box 547859, Orlando, FL 32854–7859.
12. F. L. Walls, “Reducing errors, complexity, and measurement times for PM noise measurements,” submitted to Proc. IEEE 47th Annu. Freq. Contr. Symp., 1993.
13. C. Szekely, R. E. Drullinger, F. L. Walls, J. P. Lowe, and A. Novick, “Diode-laser pumped, rubidium cell frequency standards,” submitted to Proc. 7th EFTF, Neuchatel, Switzerland, March 16–18, 1993.