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Volumn 26, Issue 1, 1994, Pages 31-42

Fault generation model and mental stress effect analysis

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; ERROR CORRECTION; ERROR DETECTION; HUMAN ENGINEERING; MATHEMATICAL MODELS; PROGRAM DEBUGGING; RELIABILITY; SOFTWARE ENGINEERING;

EID: 0028461970     PISSN: 01641212     EISSN: None     Source Type: Journal    
DOI: 10.1016/0164-1212(94)90093-0     Document Type: Article
Times cited : (14)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.