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Volumn 26, Issue 1, 1994, Pages 31-42
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Fault generation model and mental stress effect analysis
a a a
a
NTT CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
DATA REDUCTION;
ERROR CORRECTION;
ERROR DETECTION;
HUMAN ENGINEERING;
MATHEMATICAL MODELS;
PROGRAM DEBUGGING;
RELIABILITY;
SOFTWARE ENGINEERING;
FAULT GENERATION MODEL;
MENTAL STRESS EFFECTS;
SOFTWARE RELIABILITY;
COMPUTER SOFTWARE;
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EID: 0028461970
PISSN: 01641212
EISSN: None
Source Type: Journal
DOI: 10.1016/0164-1212(94)90093-0 Document Type: Article |
Times cited : (14)
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References (8)
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