Scaling behavior of YBaCuO/PrBaCuO/YBaCuO trilayer josephson junctions

Japanese Journal of Applied Physics

Volumn 33, Issue 6, 1994, Pages L766-L768

  Akoh, Hiroshi ^a   Sato, Hiroshi ^a   Nakamura, Norito ^a   Takada, Susumu ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

Critical current density; Edge junction; High Tc superconductor; IcRn products; Scaling behavior; SNS Josephson junction; Trilayer junction; YBaCuO PrBaCuO YBaCuO structure

Indexed keywords

COPPER OXIDES; CRYSTAL ORIENTATION; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; HIGH TEMPERATURE SUPERCONDUCTORS; INTERFACES (MATERIALS); PRASEODYMIUM COMPOUNDS; SUPERCONDUCTING FILMS; YTTRIUM COMPOUNDS;

CRITICAL CURRENT DENSITY; EDGE JUNCTION; PRASEODYMIUM BARIUM COPPER OXIDE; SCALING BEHAVIOR; TRILAYER JUNCTION; YTRRIUM BARIUM COPPER OXIDE;

JOSEPHSON JUNCTION DEVICES;

EID: 0028460049     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.33.L766     Document Type: Article

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