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Volumn 41, Issue 6, 1994, Pages 874-878

An Analytical Model for High Electron Mobility Transistors

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CAPACITANCE; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; ELECTRON TRANSPORT PROPERTIES; ENERGY GAP; GATES (TRANSISTOR); MATHEMATICAL MODELS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0028448049     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.293295     Document Type: Article
Times cited : (38)

References (11)
  • 1
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    • A new model for modulation doped FETs
    • C. Z. Cil and S. Tansal, “A new model for modulation doped FETs,” IEEE Electron Device Lett., vol. EDL-6, pp. 434-436, 1985.
    • (1985) IEEE Electron Device Lett. , vol.EDL-6 , pp. 434-436
    • Cil, C.Z.1    Tansal, S.2
  • 2
    • 0022688840 scopus 로고
    • An analytical and computer aided model of the AlGaAs/GaAs high electron mobility transistor
    • G. W. Wang and W. H. Ku, “An analytical and computer aided model of the AlGaAs/GaAs high electron mobility transistor" IEEE Trans. Electron Devices, vol. ED-33, pp. 657-663, 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 657-663
    • Wang, G.W.1    Ku, W.H.2
  • 3
    • 0022683226 scopus 로고
    • A MODFET dc model with improved pinch off and saturation characteristics
    • H. Rohdin and P. Roblin, “A MODFET dc model with improved pinch off and saturation characteristics,” IEEE Trans. Electron Devices, vol. ED-33,pp. 664-672, 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 664-672
    • Rohdin, H.1    Roblin, P.2
  • 4
    • 0023401964 scopus 로고
    • Nonlinear charge control in AlGaAs/GaAs modulation doped FET’s
    • W. Hughes and C. Snowden, “Nonlinear charge control in AlGaAs/GaAs modulation doped FET’s,” IEEE Trans. Electron Devices, vol. ED-34, pp. 1617-1625, 1987.
    • (1987) IEEE Trans. Electron Devices , vol.ED-34 , pp. 1617-1625
    • Hughes, W.1    Snowden, C.2
  • 6
    • 0022685950 scopus 로고
    • Circuit simulation models for the high electron mobility transistor
    • H. R. Yeager and R. W. Dutton, “Circuit simulation models for the high electron mobility transistor,” IEEE Trans. Electron Devices, vol. ED-33, pp. 682-692, 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 682-692
    • Yeager, H.R.1    Dutton, R.W.2
  • 7
    • 0025464945 scopus 로고
    • Analytical solution of the velocity saturated MOSFET/MODFET wave equation and its application to the prediction of the microwave characteristics of MODFET’s
    • P. Roblin, S. C. Kang, and H. Morkoc, “Analytical solution of the velocity saturated MOSFET/MODFET wave equation and its application to the prediction of the microwave characteristics of MODFET’s,” IEEE Trans. Electron Devices, vol. 37, pp. 1608-1622, 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , pp. 1608-1622
    • Roblin, P.1    Kang, S.C.2    Morkoc, H.3
  • 8
    • 0014533974 scopus 로고
    • General theory for pinched operation of the junction-gate FET
    • A. B. Grebene and S. K. Ghandi, “General theory for pinched operation of the junction-gate FET,” Solid-State Electron., vol. 12, pp. 573-589, 1969.
    • (1969) Solid-State Electron , vol.12 , pp. 573-589
    • Grebene, A.B.1    Ghandi, S.K.2
  • 9
    • 0022083780 scopus 로고
    • Quasi-Fermi level bending in MODFET’s and its effect on FET transfer characteristics
    • F. Ponse, W. T. Masselink, and H. Morkoc, “Quasi-Fermi level bending in MODFET’s and its effect on FET transfer characteristics,” IEEE Trans. Electron Devices, vol. ED-32, p. 1017-1023, 1985.
    • (1985) IEEE Trans. Electron Devices , vol.ED-32 , pp. 1017-1023
    • Ponse, F.1    Masselink, W.T.2    Morkoc, H.3
  • 10
    • 0022520568 scopus 로고
    • Classical versus quantum mechanical calculation of the electron distribution at the n-AlGaAs/GaAs heterointerface
    • J. Yoshida, “Classical versus quantum mechanical calculation of the electron distribution at the n-AlGaAs/GaAs heterointerface,” IEEE Trans. Electron Devices, vol. ED-33, pp. 154-156, 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 154-156
    • Yoshida, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.