PIN Detector Arrays and Integrated Readout Circuitry on High-Resistivity Float-Zone Silicon

IEEE Transactions on Electron Devices

Volumn 41, Issue 6, 1994, Pages 903-912

  Snoeys, Walter ^a   Plumme, James D ^a   Parker, Sherwood ^b   Kenney, Christopher ^b  

^a STANFORD UNIVERSITY   (United States)

^b UNIVERSITY OF HAWAII   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARRAYS; CHARGE CARRIERS; CMOS INTEGRATED CIRCUITS; COMMUNICATION CHANNELS (INFORMATION THEORY); ELEMENTARY PARTICLES; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; IONIZATION OF SOLIDS; READOUT SYSTEMS; SEMICONDUCTING SILICON; SPURIOUS SIGNAL NOISE;

CARRIER LIFETIME; HIGH RESISTIVITY FLOAT ZONE SILICON; INTEGRATED READOUT CIRCUITRY; IONIZING PARTICLES; PIN DETECTOR ARRAYS; PIN DIODE BASED PIXEL DETECTOR;

SEMICONDUCTOR DIODES;

EID: 0028444878     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.293300     Document Type: Article

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