SCOPUS 정보 검색 플랫폼

Journal of Electron Spectroscopy and Related Phenomena

Volumn 67, Issue 3, 1994, Pages 439-461

The determination of depth profiles from angle-dependent XPS using maximum entropy data analysis

(2) Livesey, A K a Smith, G C a

a SHELL RESEARCH AND TECHNOLOGY CENTRE (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA REDUCTION; DATA STRUCTURES; PROBABILITY; STATISTICAL METHODS; X RAY SPECTROSCOPY;

ELEMENTAL DEPTH PROFILES; LOGARITHMIC PROBABILITY FUNCTION; MAXIMUM ENTROPY;

PHOTOELECTRON SPECTROSCOPY;

EID: 0028444677 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/0368-2048(93)02035-K Document Type: Article

Times cited : (71)

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