Atomic force microscopy images of natural zeolite surfaces observed under ambient conditions

Japanese Journal of Applied Physics

Volumn 33, Issue 6 S, 1994, Pages 3761-3763

  Komiyama, Masaharu ^a   Yashima, Tateaki ^b  

^a UNIVERSITY OF YAMANASHI   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Atomic force microscopy; Heulandite; Stilbite; Zeolite

Indexed keywords

BANDPASS FILTERS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; FAST FOURIER TRANSFORMS; IMAGE ANALYSIS; MICROSCOPIC EXAMINATION; SURFACES;

ATOMIC FORCE MICROSCOPY; HEULANDBITE; STILBITE;

ZEOLITES;

EID: 0028444437     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.33.3761     Document Type: Article

References (6)

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3. J. E. MacDougall, S. D. Cox, G. D. Stucky, A. L. Weisenhorn, P. K. Hansma and W. S. Wise: Zeolites 11 (1990) 429.
4. L. Scandella, N. Kruse and R. Prins: Surf. Sci. Lett. 281 (1993) L331.
5. M. Komiyama, M. Kubo and A. Miyamoto: in preparation.
6. H. Hartman, G. Sposito, A. Yang, S. Manne, S. A. C. Gould and P. K. Hansma: Clays Clay Miner. 38 (1990) 337.