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Volumn 312, Issue 3, 1994, Pages 399-410

A STM study of the effects of the ion incident angle and energy on surface damage induced by Ar+ bombardment of HOPG

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHARACTERIZATION; GRAPHITE; IONS; MICROSCOPIC EXAMINATION; RADIATION DAMAGE; STATISTICAL METHODS;

EID: 0028443896     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(94)90731-5     Document Type: Article
Times cited : (56)

References (33)
  • 10
    • 84912934155 scopus 로고    scopus 로고
    • S. Bouffard, J. Cousty, Y. Pennec and F. Thibaudau, Rad. Eff. Defects, to be published.
  • 22
    • 84912948681 scopus 로고    scopus 로고
    • D.K. Brice, Ion Implantation Range and Energy Deposition Distributions. Vol. 1, p. 17.
  • 27
    • 84996211126 scopus 로고
    • An investigation of thermal spikes by studying the high energy sputtering of metals at elevated temperatures
    • (1965) Philosophical Magazine , vol.11 , pp. 291
    • Nelson1
  • 28
    • 0346201022 scopus 로고
    • Evidence for heated spikes in bombarded gold from the energy spectrum of atoms ejected by 43 kev a+and xe+ions
    • (1962) Philosophical Magazine , vol.7 , pp. 2015
    • Thompson1    Nelson2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.