SCOPUS 정보 검색 플랫폼

Volumn 33, Issue 6 S, 1994, Pages 3785-3790

Scanning near-field optical microscopy and scanning thermal microscopy

Author keywords

Scanning near field optical microscopy; Scanning thermal microscopy; Scanning tunneling microscopy and atomic force microscopy

Indexed keywords

DESIGN; FLUORESCENCE; LIGHT POLARIZATION; MICROSCOPES; OPTICAL RESOLVING POWER; TEMPERATURE; THERMAL CONDUCTIVITY;

ATOMIC FORCE MICROSCOPY; IMAGE CONTRAST; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SCANNING THERMAL MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

MICROSCOPIC EXAMINATION;

EID: 0028443485 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.33.3785 Document Type: Article

Times cited : (130)

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