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Volumn 77, Issue 5, 1994, Pages 1209-1216

Use of Transmission Electron Microscopy for the Characterization of Rapid Thermally Annealed, Solution‐Gel, Lead Zirconate Titanate Films

(5) Reaney, Ian M a Brooks, Keith a Klissurska, Radosveta a Pawlaczyk, Czezlaw a Setter, Nava a

a EPFL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CERAMIC MATERIALS; COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DIELECTRIC FILMS; DIELECTRIC PROPERTIES OF SOLIDS; LEAD COMPOUNDS; PYROLYSIS; THERMAL EFFECTS; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY;

A SITE STOICHIOMETRY; HIGH RESOLUTION ELECTRON MICROSCOPY; LEAD DEFICIENT CRYSTALS; LEAD ZIRCONATE TITANATE FILMS; RAPID THERMAL ANNEALING; SOLUTIONGEL SPINNING DEPOSITION; X RAY DIFFRACTION;

FERROELECTRIC MATERIALS;

EID: 0028442219 PISSN: 00027820 EISSN: 15512916 Source Type: Journal
DOI: 10.1111/j.1151-2916.1994.tb05394.x Document Type: Article

Times cited : (145)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.