Critical behavior in the satisfiability of random Boolean expressions

Science

Volumn 264, Issue 5163, 1994, Pages 1297-1301

  Kirkpatrick, Scott ^a   Selman, Bart ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ARTIFICIAL INTELLIGENCE; BOOLEAN FUNCTIONS; COMPUTATIONAL COMPLEXITY; COMPUTER SCIENCE; GRAPH THEORY;

CRITICAL PHENOMENA; FINITE SIZE SCALING; RANDOM BOOLEAN EXPRESSIONS; STATISTICAL PHYSICS; THRESHOLD PHENOMENA;

MOLECULAR DYNAMICS;

EID: 0028434242     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.264.5163.1297     Document Type: Article

References (0)