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Volumn 5, Issue 5, 1994, Pages 589-592

The scanning dielectric microscope

Author keywords

[No Author keywords available]

Indexed keywords

AQUEOUS ENVIRONMENT; COAXIAL PROBE ELECTRODES; COLLOIDAL PARTICLES; SCANNING DIELECTRIC MICROSCOPE;

EID: 0028433841     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/5/5/020     Document Type: Article
Times cited : (35)

References (14)
  • 6
    • 34848919386 scopus 로고
    • Surface studies by scanning tunneling microscopy
    • Binnig G, Rohrer H, Gerber Ch and Weibel E 1982 Surface studies by scanning tunneling microscopy Phys. Rev. Lett. 49 57-61 DOI: 10.1103/PhysRevLett.49.57
    • (1982) Phys. Rev. Lett , vol.49 , pp. 57-61
    • Binnig, G.1    Rohrer, H.2    Gerber, C.3    Weibel, E.4
  • 7
    • 0012618901 scopus 로고
    • Atomic force microscope
    • Binnig G, Quate C and Gerber Ch 1986 Atomic force microscope Phys. Rev. Lett. 56 930-3 DOI: 10.1103/PhysRevLett.56.930
    • (1986) Phys. Rev. Lett , vol.56 , pp. 930-933
    • Binnig, G.1    Quate, C.2    Gerber, C.3
  • 8
    • 0037867862 scopus 로고
    • Scanning capacitance microscopy
    • Matey J R and Blanc J 1985 Scanning capacitance microscopy J. Appl. Phys. 57 1437-44 DOI: 10.1063/1.334506
    • (1985) J. Appl. Phys , vol.57 , pp. 1437-1444
    • Matey, J.R.1    Blanc, J.2
  • 9
    • 36549094573 scopus 로고
    • Scanning capacitance microscopy on a 25 nm scale
    • Williams C C, Hough W P and Rishton S A 1989 Scanning capacitance microscopy on a 25 nm scale Appl. Phys. Lett. 55 203-5 DOI: 10.1063/1.102096
    • (1989) Appl. Phys. Lett , vol.55 , pp. 203-205
    • Williams, C.C.1    Hough, W.P.2    Rishton, S.A.3
  • 10
    • 0023960467 scopus 로고
    • Scanning capacitance microscopy
    • Bugg C D and King P J 1988 Scanning capacitance microscopy J. Phys. E: Sci. Instrum. 21 147-51 DOI: 10.1088/0022-3735/21/2/003
    • (1988) J. Phys. E: Sci. Instrum , vol.21 , pp. 147-151
    • Bugg, C.D.1    King, P.J.2
  • 11
    • 0024604960 scopus 로고
    • The scanning ion-conductance microscope
    • Hansma P K, Drake B, Marti O, Gould S A C and Prater C B 1989 The scanning ion-conductance microscope Science 243 641-3 DOI: 10.1126/science.2464851
    • (1989) Science , vol.243 , pp. 641-643
    • Hansma, P.K.1    Drake, B.2    Marti, O.3    Gould, S.4    Prater, C.B.5
  • 12
    • 0020754075 scopus 로고
    • Dielectric observations on polystyrene microcapsules and the theoretical analysis with reference to interfacial polarization
    • Zhang H Z, Sekine K, Hanai T and Koizumi N 1983 Dielectric observations on polystyrene microcapsules and the theoretical analysis with reference to interfacial polarization Collid Polymer Sci. 261 381-9 DOI: 10.1007/BF01418210
    • (1983) Collid Polymer Sci , vol.261 , pp. 381-389
    • Zhang, H.Z.1    Sekine, K.2    Hanai, T.3    Koizumi, N.4
  • 13
    • 0028319449 scopus 로고
    • Dielectric measurement of a single sub-millimeter size microcapsule
    • at press
    • Asami K and Zhao K S 1994 Dielectric measurement of a single sub-millimeter size microcapsule Collid Polymer Sci. at press
    • (1994) Collid Polymer Sci
    • Asami, K.1    Zhao, K.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.