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Volumn 43, Issue 1-3, 1994, Pages 305-310

Piezoelectric force sensor for scanning force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION; PIEZOELECTRIC TRANSDUCERS; SENSORS; SILICA; THIN FILMS;

EID: 0028426819     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/0924-4247(93)00665-Q     Document Type: Article
Times cited : (29)

References (21)
  • 3
    • 0000399084 scopus 로고
    • Atomic resolution imaging of a nonconductor by atomic force microscopy
    • (1987) J. Appl. Phys. , vol.62 , pp. 2599-2602
    • Albrecht1    Quate2
  • 9
    • 0026899890 scopus 로고
    • Force measurement with a piezoelectric cantilever in a scanning force microscope
    • (1992) Ultramicroscopy , vol.42-44 , pp. 1464-1469
    • Tansock1    Williams2
  • 10
    • 0027679006 scopus 로고
    • Development of a force sensor for atomic force microscopy using piezoelectric thin films
    • (1993) Nanotechnology , vol.4 , pp. 1-7
    • Itoh1    Suga2
  • 15
    • 0013273203 scopus 로고
    • ZnO piezoelectric film and its applications
    • (in Japanese)
    • (1977) Oyo Buturi , vol.48 , pp. 663-676
    • Chubachi1
  • 16
    • 0012987732 scopus 로고
    • Preparation of Pb(Zr, Ti)O3 thin films by sol gel processing: electrical, optical, and electro-optic properties
    • (1988) J. Appl. Phys. , vol.64 , pp. 2717-2724
    • Yi1    Wu2    Sayer3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.