Thermal diffusivity measurement of GaAs/AlGaAs thin-film structures

Journal of Heat Transfer

Volumn 116, Issue 2, 1994, Pages 325-331

  Chen, G ^a   Tien, C L ^b   Wu, X ^b,c   Smith, J S ^b  

^a DUKE UNIVERSITY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c XILINX INC   (United States)

Author keywords

Conduction; Measurement techniques; Thermophysical properties

Indexed keywords

HEAT TRANSFER; LASER APPLICATIONS; MOLECULAR BEAM EPITAXY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; THERMAL DIFFUSION; THIN FILMS;

ALUMINUM GALLIUM ARSENIDE; MEASUREMENT TECHNIQUES; THERMAL DIFFUSIVITY;

SEMICONDUCTING FILMS;

EID: 0028425206     PISSN: 00221481     EISSN: 15288943     Source Type: Journal    
DOI: 10.1115/1.2911404     Document Type: Article

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