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Volumn 10, Issue 3, 1994, Pages 195-200

Hardware reliability assurance and field experience in a telecom environment

Author keywords

Feedback; Improvement; Qualification; Reliability; Time dependency; Zero defect

Indexed keywords

COSTS; ELECTRON DEVICE TESTING; ELECTRONICS PACKAGING; FAILURE ANALYSIS; IMPROVEMENT; NETWORK COMPONENTS; PROCESS ENGINEERING; PRODUCT DESIGN; QUALITY ASSURANCE; QUALITY CONTROL; TELECOMMUNICATION SYSTEMS; TELEPHONE;

EID: 0028425065     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.4680100310     Document Type: Article
Times cited : (4)

References (3)
  • 1
    • 84990653695 scopus 로고
    • ‘Results from accelerated life testing of memories and from 1–3 years use of microcircuits’, SINTOM Seminar, Copenhagen, 4–6 September, (gives field reliability information on 1–4k DRAMs).
    • (1979)
    • Hallberg, Ö.1
  • 2
    • 84990707673 scopus 로고
    • ‘NMOS voltage break‐down characteristics compared with accelerated life tests and field use data’, IEEE/PROC.IRPS, (gives field reliability information on 4–16k DRAMs)
    • (1981) , pp. 28-32
    • Hallberg, Ö.1
  • 3
    • 84990653689 scopus 로고
    • MIL‐I‐38535, Military Specification, Integrated Circuits, Manufacturing, General Specifications., (gives information on the QML concept).
    • (1989)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.