Developing Linear Error Models for Analog Devices

IEEE Transactions on Instrumentation and Measurement

Volumn 43, Issue 2, 1994, Pages 157-163

  Stenbakken, Gerard N ^a   Souders, T Michael ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; COMPUTER SIMULATION LANGUAGES; ERROR ANALYSIS; MATHEMATICAL MODELS; MATRIX ALGEBRA; MEASUREMENT ERRORS; OPTIMIZATION; PARAMETER ESTIMATION; VECTORS;

ANALOG DEVICES; LINEAR ERROR MODELS;

ELECTRONIC EQUIPMENT;

EID: 0028422352     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.293413     Document Type: Article

References (6)

1. T. M. Souders and G. N. Stenbakken, “Modeling and test point selection for data converter testing,” in 1985 IEEE Int. Test Conf. Proc. New York: IEEE Press, Nov. 1985, pp. 813-817.
2. G. N. Stenbakken and T. M. Souders, “Test point selection and testability measures via QR factorization of linear models,” IEEE Trans. Instrum. Meas., vol. IM-36, pp. 406-410, June 1987.
3. T. M. Souders and G. N. Stenbakken, “A comprehensive approach for modeling and testing analog and mixed-signal devices,” in Proc. 1990 Int. Test Conf., IEEE Computer Society Press, Sept. 1990, pp. 169-176.
4. G. N. Stenbakken and T. M. Souders, “Linear error modeling of analog and mixed-signal devices,” in Proc. 1991 Int. Test Conf., IEEE Computer Society Press, Sept. 1991, pp. 573-581.
5. G. W. Stewart, Introduction to Matrix Computations. New York, NY: Academic, 1974.
6. J. J. Dongarra, J. R. Bunch, C. B. Moler, and G. W. Stewart, UNPACK User's Guide, SIAM, Philadelphia, PA, 1979.