Calcium Concentration Dependence of the Intergranular Film Thickness in Silicon Nitride

Journal of the American Ceramic Society

Volumn 77, Issue 4, 1994, Pages 911-914

  Tanaka, Isao ^a,b   Kleebe, Hans‐Joachim ^a,b   Cinibulk, Michael K ^a,b   Bruley, John ^a,b   Clarke, David R ^a,b   Ruhle, Manfred ^a,b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM; COMPOSITION EFFECTS; DOPING (ADDITIVES); FILMS; GRAIN BOUNDARIES; MICROSCOPIC EXAMINATION; SILICON NITRIDE; THICKNESS MEASUREMENT; VAN DER WAALS FORCES;

DEBYE LENGTH; ELECTRICAL DOUBLE LAYER FORCE; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERGRANULAR FILM THICKNESS; NANOBEAM ANALYTICAL ELECTRON MICROSCOPY; STRUCTURAL STERIC FORCE;

CERAMIC MATERIALS;

EID: 0028422249     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1994.tb07246.x     Document Type: Article

References (14)

1. On the Equilibrium Thickness of Intergranular Glass Phases in Ceramic Materials
2. Possible Electrical Double‐Layer Contribution to the Equilibrium Thickness of Intergranular Glass Films in Polycrystalline Ceramics
3. Intergranular Phases in Polycrystalline Ceramics
4. Influence of the Secondary Phase Chemistry on Grain Boundary Film Thickness in Silicon Nitride
5. Statistical Analysis of the Intergranular Film Thickness in Silicon Nitride Ceramics
6. Hot Isostatic Press Sintering and Properties of Silicon Nitride without Additives
7. 4 at Elevated Temperatures
8. 4
9. High Temperature Environmental Strength Degradation of Hot–Pressed Silicon Nitride: An Experimental Test
10. Hot Isostatic Pressing of Ceramics
11. On the Detection of Thin Intergranular Films by Electron Microscopy
12. Automated Processing of Parallel‐Detection EELS Data